Basic Spectrometer BAN215

The instruments of the BAN family cover a very wide range of applications. Their particular strength lies in quick and precise materials analysis and user-friendly handling, for e.g. the analysis of precious metal and gold alloys. The instruments are also useful in the analysis of thin coatings in the electronics and PC Board industries.

All models have in common the geometric arrangement of their hardware components. X-ray source and detector are located below the measurement chamber. The measurement is carried out from bottom to top.

This allows for fast and easy positioning of the samples. The instruments of the BAN family are available in several versions that differ with regard to X-ray tubes, detectors, number of apertures and filters.

Therefore, the BAN family offers optimized solutions for various applications and accuracy requirements while delivering excellent cost-effectiveness.

The assortment of BAN instruments also includes models with both hardware and software specially designed to meet the unique requirements of the jewelry industry and the gold trade.

Examples from practical applications:

Instruments with different types of detectors are used for the analysis of gold alloys. For example, the BAN 215, which is equipped with an inexpensive proportional counter tube detector, is ideal for analyzing simple gold alloys with only a few elements, such as yellow gold alloys with Au, Ag and Cu. However, if alloys with many elements or overlapping fluorescence peaks are to be measured, then semiconductor detectors are better suited, as in the BAN 220 or BAN 250. With their significantly better resolution, they also enable the separation of, for example, gold and platinum, which is critical in the analysis of dental alloys and fused precious metal alloys.

Characteristics

X-ray tube with W-anode and glass window or micro-focus X-ray tube with W-anode and beryllium window.

Maximum operating conditions: 50 kV, 50W Proportional counter tube as X-ray detector Aperture: fixed or 4-x automatically exchangeable, Ø 0.2 mm to Ø 2 mm Primary filter: fixed, 3-x exchangeable or 6-x automatically exchangeable Fixed sample support Video camera for optical observation of the measurement location along the axis of the primary X-ray beam.

Crosshairs with calibrated scale (ruler) and display of the measurement spot Design-approved, fully protected instrument compliant with the German X-ray ordinance § 4 Para. 3

Typical fields of application

Gold and precious metal analysis in the jewellery and watch industries Measurement of thin coatings of only a few nanometres, such as Au and Pd on printed circuit boards and electronics components Trace analysis (e.g. harmful substances in electronic components (RoHS) or tools) with BAN215 Analysis of light elements such as Al, Si, P with the BAN 250 General materials analysis and coating thickness measurement in laboratories, testing institutions and universities